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SEM Snowflake Image Pillow Set

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MSRP $35.00 Product Sale −29%
Sale $25.00 + HALLOWEEN20 −20%
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Description
Features
Applications
Sterilization Method
Compatible Container
SKU Nomenclature
Safety Usage Guidelines
Specification
Documentation
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Great Gift Set for Snowflake Enthusiasts!

SEM Snowflake Image Set contains everything you need to promote your the splendor of snowflakes! Pillow, Coasters and thank you cards are a great conversation starter and decor for either your home or office, during winter or any time of year.

Features

  • The pillow is a great addition to a chair, couch or bed!
  • Protect your furniture in style with the coaster set!
  • Say thank you in style with the thank you cards!

High quality image produced through SEM (Scanning Electron Microscope) by scanning the surface with a focused beam of electrons. Learn more below.

Specifications

  • Quantity: 6 coasters
  • Color(s): blue, black, white and gray
  • SKU/Product Code: PILSET 
  • Size/Dimensions;
  • Coasters: 4" x 4" x 0.25"
  • Pillow: 14" x 14" x 4"
  • Thank You Cards: 5.47" x 4.21"
  • Total Weight: 1.25 lbs

SEM Snowflake Gift set - pillow- coasters - thank you cards

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Other SEM Snowflake options;

Learn more about SEM

A scanning electron microscope (SEM) is a type of electron microscope that produces images of a sample by scanning the surface with a focused beam of electrons. The electrons interact with atoms in the sample, producing various signals that contain information about the surface topography and composition of the sample. The electron beam is scanned in a raster scan pattern, and the position of the beam is combined with the intensity of the detected signal to produce an image. In the most common SEM mode, secondary electrons emitted by atoms excited by the electron beam are detected using a secondary electron detector (Everhart-Thornley detector). The number of secondary electrons that can be detected, and thus the signal intensity, depends, among other things, on specimen topography. SEM can achieve resolution better than 1 nanometer.

Specimens are observed in high vacuum in conventional SEM, or in low vacuum or wet conditions in variable pressure or environmental SEM, and at a wide range of cryogenic or elevated temperatures with specialized instruments.

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